Resistivity Correction Factor for the Four-Point Probe Method on Cylindrical Materials.

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  • Yamashita Masato
    Toyama University, 3190 Gofuku, Toyama, Toyama 930, Japan
  • Nishii Toshifumi
    Mitsubishi Chemical Corporation, 1–5 Nihonbashi Muromachi 4–chome, Chuo–ku, Tokyo 103, Japan
  • Kurihara Hiroshi
    Mitsubishi Chemical Corporation, 1–5 Nihonbashi Muromachi 4–chome, Chuo–ku, Tokyo 103, Japan

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説明

The correction factor F which is necessary to obtain resistivity by means of the four-point probe array located on the convex surface of a cylindrical material is investigated. Electric potential in a finite-length cylindrical material having a current source and a current sink is derived by solving Poisson's equation under various boundary conditions. The correction factor F is obtained using the potential. The resistance measurements are performed for isotropic graphite rods with different radius or different length. It is found from the experimental results that the correction factor F revises data accurately and yields a reasonable resistivity.

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