Emission Properties of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7-δ</sub>-Film Photoswitches as Terahertz Radiation Sources

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  • Tani Masahiko
    Kansai Advanced Research Center, Communications Research Laboratory, MPT, 588–2 Iwaoka, Nishi–ku, Kobe 651–24, Japan
  • Tonouchi Masayoshi
    Kansai Advanced Research Center, Communications Research Laboratory, MPT, 588–2 Iwaoka, Nishi–ku, Kobe 651–24, Japan
  • Hangyo Masanori
    Research Center for Superconducting Materials and Electronics, Osaka University, Suita, Osaka 565, Japan
  • Wang Zhen
    Kansai Advanced Research Center, Communications Research Laboratory, MPT, 588–2 Iwaoka, Nishi–ku, Kobe 651–24, Japan
  • Onodera Noriaki
    Kansai Advanced Research Center, Communications Research Laboratory, MPT, 588–2 Iwaoka, Nishi–ku, Kobe 651–24, Japan
  • Sakai Kiyomi
    Kansai Advanced Research Center, Communications Research Laboratory, MPT, 588–2 Iwaoka, Nishi–ku, Kobe 651–24, Japan

書誌事項

タイトル別名
  • Emission Properties of YBa2Cu3O7-.DELTA. Film Photoswitches as Terahertz Radiation Sources.

抄録

Terahertz (THz) radiation is generated from biased YBa2Cu3O7-δ (YBCO)-film photoswitches by exciting them with femtosecond (fsec) laser pulses. The pump power, bias current and temperature dependence of the radiation amplitude is measured in order to characterize the emission properties of the high-critical-temperature (high-T C) superconducting photoswitches. The radiation amplitude increases superlinearly with increasing pump power in the moderate pump power range and saturates at high pump power. The bias current dependence of the radiation amplitude shows superlinear increase for high bias current. The temperature dependence of the radiation amplitude increases with increasing temperature except near the critical temperature. The features observed in the measurements are explained by the thermal and transient changes of the complex refractive index, which affects the output coupling efficiency of the THz radiation from the high-T C superconducting film to the free space.

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