Spin-Dependent Surface Characteristics of an Absorbed Hydrogen Atom under a Scanning Tunneling Microscope Environment–Atom Manipulation by Magnetic Field
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- Sawamura Makoto
- CREST/JST, Nanoelectronics, Faculty of Engineering, Hokkaido University, Kita 13, Nishi 8, Kita–ku, Sapporo 060–8628, Japan Nanoelectronics, Faculty of Engineering, Hokkaido University, Kita 13, Nishi 8, Kita–ku, Sapporo 060–8628, Japan
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- Mukasa Koichi
- CREST/JST, Nanoelectronics, Faculty of Engineering, Hokkaido University, Kita 13, Nishi 8, Kita–ku, Sapporo 060–8628, Japan Nanoelectronics, Faculty of Engineering, Hokkaido University, Kita 13, Nishi 8, Kita–ku, Sapporo 060–8628, Japan
書誌事項
- タイトル別名
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- Spin-Dependent Surface Characteristics of an Absorbed Hydrogen Atom under a Scanning Tanneling Microscope Environment-Atom Manipulation by Magnetic Field.
- 公開日
- 1999
- DOI
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- 10.1143/jjap.38.3853
- 公開者
- The Japan Society of Applied Physics
この論文をさがす
説明
We investigate the electronic states of a scanning tunneling microscope environment using first principles molecular orbital calculations, explicitly including spin states. We employ a cluster model comprised of a silicon surface and an absorbed hydrogen atom under a gold probe tip. We find that spin multiplicity of the system drastically changes the potential energy surfaces of the absorbed atom between the surface and the probe. Under the gold probe tip, it is observed that the desorption energy for a hydrogen atom from the silicon surface decreases from 4.09 eV to 2.84 eV when an external electric field, biased sample-negative, is applied along the cluster axis with the value of 0.3 V/Å at the singlet spin state. At the triplet spin state, however, the barrier of the potential well completely disappears under the electric field, sample-negative bias, with the value of 0.1 V/Å, which induces atom transfer from the surface to the probe. We assume that the tip-sample distance is 6.0 Å.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 38 (6B), 3853-3855, 1999
The Japan Society of Applied Physics
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キーワード
詳細情報 詳細情報について
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- CRID
- 1390282681228724736
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- NII論文ID
- 210000045397
- 130004526405
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- ISSN
- 13474065
- 00214922
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
- OpenAIRE
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- 抄録ライセンスフラグ
- 使用不可

