Low-Temperature Growth of Si Oxide with Good Electrical Qualities Using Helicon-Wave-Excited O<sub>2</sub>–Ar Plasma and Forming Gas Annealing
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- Tsukuda Tatsuaki
- Faculty of Science and Technology, Science University of Tokyo, Noda, Chiba 278-8510, Japan
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- Ikoma Hideaki
- Faculty of Science and Technology, Science University of Tokyo, Noda, Chiba 278-8510, Japan
書誌事項
- タイトル別名
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- Low-Temperature Growth of Si Oxide with Good Electrical Qualities Using Helicon-Wave-Excited O2-Ar Plasma and Forming Gas Annealing.
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抄録
P-type Si(100) substrate was oxidized using helicon-wave-excited O2–Ar plasma at low temperatures. Post–thermal annealings were performed after oxidation in forming gases (FGs) containing 3% and 5% H2. The capacitance–voltage (C–V) characteristics were significantly improved by post-thermal annealing at 500°C in FG containing 3% H2, and a minimum interface state density of 1.5 × 1010,eV-1cm-2 was obtained, which was comparable to those at device-grade thermal-Si–oxide/Si interfaces. The interface-state densities was about ∼1011,eV-1cm-2 for the oxide samples post-thermally annealed in O2 ambient. The Fowler–Nordheim (FN) tunneling current is the dominant leakage current mechanism similar to that of thermal Si oxide. However, the barrier height was somewhat smaller than that of the thermal oxide. FN current stress experiments were carried out to simulate the hot-carrier injection endurance of the grown oxide film with both electrical polarities of the stress voltages. The shift of the threshold voltage was the smallest for the oxide sample post-thermally annealed in FG containing 3% H2. The results of the FN stressing could be well interpreted by the surface plasmon and avalanche breakdown models.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 39 (1), 8-13, 2000
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390282681229476224
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- NII論文ID
- 210000048211
- 110003956302
- 130004526657
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- NII書誌ID
- AA10457675
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- ISSN
- 13474065
- 00214922
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- NDL書誌ID
- 4974720
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
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