Determination of Film Thickness and Anisotropy of the Refactive Indices in 4-octyl-4'-cyanobiphenyl Liquid Crystalline Free-Standing Films

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  • Matsuhashi Nobuaki
    Department of Electrical Engineering, Hachinohe National College of Technology, Uwanotai 16-1, Tamonoki, Hachinohe, Aomori 039-1192, Japan
  • Okumoto Yoshitaka
    Department of Electrical Engineering, Faculty of Engineering, Nagaoka University of Technology, 1603 Kamitomioka, Nagaoka, Niigata 940-2188, Japan
  • Kimura Munehiro
    Department of Electrical Engineering, Faculty of Engineering, Nagaoka University of Technology, 1603 Kamitomioka, Nagaoka, Niigata 940-2188, Japan
  • Akahane Tadashi
    Department of Electrical Engineering, Faculty of Engineering, Nagaoka University of Technology, 1603 Kamitomioka, Nagaoka, Niigata 940-2188, Japan

書誌事項

タイトル別名
  • Determination of Film Thickness and Anisotropy of the Refractive Indices in 4-octyl-4'-cyanobiphenyl Liquid Crystalline Free-Standing Films.
  • Determination of Film Thickness and Anisotropy of the Refractive Indices in 4-octyl-4<sup>′</sup>-cyanobiphenyl Liquid Crystalline Free-Standing Films

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説明

The layer structure of 4-octyl-4′-cyanobiphenyl (8CB) liquid crystalline free-standing films (FSFs) was studied. By transmission ellipsometry using a photoelastic modulator (PEM), the incidence angle dependence of the phase difference was measured with high resolution. The theoretical characteristics in the smectic A (SmA) phase structure were calculated by the geometric analysis method, changing the film thickness and the anisotropy of the refractive indices as parameters. Then, we were able to accurately determine the film thickness and the anisotropy of the refractive indices (n|| = 1.665, n⊥ = 1.523) of 8CB-FSF, by fitting the simulated characteristics to the experimental characteristics using the least-squares method.

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