Modern X-ray Spectroscopy III. X-ray Fluorescence Holography
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- HAYASHI Kouichi
- Institute for Materials Research, Tohoku University
Bibliographic Information
- Other Title
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- X線分光の現在 III.蛍光X線ホログラフィー
- Xセン ブンコウ ノ ゲンザイ 3 ケイコウ Xセン ホログラフィー
- III. X-ray Fluorescence Holography
- III.蛍光X線ホログラフィー
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Abstract
X-ray fluorescence holography (XFH) provides three dimensional atomic images around specified elements. The XFH uses atoms as a wave source or monitor of interference field within a crystal sample, and therefore it can record both intensity and phase of scattered X-rays. Its current performance makes it possible to apply to ultra thin film, impurity and quasicrystal. In this article, I show the theory including solutions for twin image problem, advanced measuring system, data processing for reconstruction of the atomic images and for obtaining accurate atomic positions, applications using resonant X-ray scattering and X-ray excited optical luminescence, and an example of XFH result on the local structure around copper in silicon steal.
Journal
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- Journal of the Spectroscopical Society of Japan
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Journal of the Spectroscopical Society of Japan 57 (3), 124-135, 2008
The Spectroscopical Society of Japan
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Details 詳細情報について
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- CRID
- 1390282681236606336
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- NII Article ID
- 10020861749
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- NII Book ID
- AN00222531
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- ISSN
- 18846785
- 00387002
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- NDL BIB ID
- 9553202
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed