Development of Deep Ultraviolet micro-Raman Spectroscopy-Characterization of nanosurface of semiconductors-
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- NAKASHIMA Shin-ichi
- Power Electronics Research Center, National Institute of Advanced Industrial Science and Technology AIST Tsukuba central
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- MITANI Takashi
- Power Electronics Research Center, National Institute of Advanced Industrial Science and Technology AIST Tsukuba central
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- OKUMURA Hajime
- Power Electronics Research Center, National Institute of Advanced Industrial Science and Technology AIST Tsukuba central
Bibliographic Information
- Other Title
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- 極紫外顕微ラマン分光法の開発―半導体ナノ表面層の評価―
- キョク シガイケンビラマン ブンコウホウ ノ カイハツ ハンドウタイ ナノ ヒョウメンソウ ノ ヒョウカ
- Characterization of nanosurface of semiconductors
- 半導体ナノ表面層の評価
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Abstract
Recent advance in instrumentations has provided progress in deep ultraviolet (DUV) Raman spectroscopy. This technique has enabled to characterize thin surface layers of wide gap semiconductors, because the penetra-tion depth of the DUV light is very shallow for these materials. We have briefly reviewed present status of the DUV Raman spectroscopy and its application to studies of inorganic and organic materials. Results of the DUV Raman characterization of surfaces and damage in nano-scaled surface layers which is induced by processing for device fabrication are also described.
Journal
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- Journal of the Spectroscopical Society of Japan
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Journal of the Spectroscopical Society of Japan 55 (5), 295-307, 2006
The Spectroscopical Society of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390282681236741376
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- NII Article ID
- 10018105773
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- NII Book ID
- AN00222531
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- ISSN
- 18846785
- 00387002
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- NDL BIB ID
- 8548203
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed