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New Frequency Stabilization Method of a Semiconductor Laser Using the Faraday Effect of the Rb-D2 Absorption Line
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- Nimonji Toshiya
- C/O Sato Lab., Graduate School of Science and Technology, Niigata University
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- Ito Shin-ichi
- C/O Sato Lab., Graduate School of Science and Technology, Niigata University
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- Sawamura Akihiko
- C/O Sato Lab., Graduate School of Science and Technology, Niigata University
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- Sato Takashi
- Faculty of Engineering, Niigata University
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- Ohkawa Masashi
- Faculty of Engineering, Niigata University
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- Maruyama Takeo
- Faculty of Engineering, Niigata University
Bibliographic Information
- Other Title
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- New Frequency Stabilization Method of a Semiconductor Laser Using the Faraday Effect of the Rb-D<sub>2</sub> Absorption Line
- Published
- 2004
- DOI
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- 10.1143/jjap.43.2504
- Publisher
- The Japan Society of Applied Physics
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Description
We have applied a precise amount of electrical feedback into laser injection current to stabilize the oscillation frequency of a semiconductor laser. This feedback method usually requires a small direct modulation to the laser injection current to obtain an error signal. This broadens the oscillation width of the laser diode, but certain applications, such as those related to coherent optical communications and measurements, require a narrower oscillation linewidth. Thus, we have attempted to obtain the error signal and stabilize the laser oscillation frequency in a narrower oscillation linewidth using the Faraday effect of the Rb absorption line. Our next task for the Faraday-effect-based method involves frequency stabilization, which we accomplish using a large frequency discrimination gain Gd. By incorporating our “PEAK” circuit, which utilizes the envelope detection method to determine the switching points between two different absorption signals, we increase Gd in our improved PEAK methods.
Journal
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 43 (5A), 2504-2509, 2004
The Japan Society of Applied Physics
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Keywords
Details 詳細情報について
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- CRID
- 1390282681241532800
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- NII Article ID
- 210000055471
- 10012947167
- 130004531940
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- NII Book ID
- AA10457675
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- ISSN
- 13474065
- 00214922
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- NDL BIB ID
- 6941955
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- Text Lang
- en
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- Data Source
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- JaLC
- NDL Search
- Crossref
- CiNii Articles
- OpenAIRE
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- Abstract License Flag
- Disallowed

