Heteroepitaxial Growth and Ferroelectricity of Bi<sub>3.25</sub>La<sub>0.75</sub>Ti<sub>3</sub>O<sub>12</sub>Films on n-GaN/Al<sub>2</sub>O<sub>3</sub>(0001) Substrates Prepared by Pulsed-Laser Deposition

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  • Heteroepitaxial Growth and Ferroelectricity of Bi3.25La0.75Ti3O12 Films on n-GaN/Al2O3(0001) Substrates Prepared by Pulsed-Laser Deposition

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Heteroepitaxial Bi3.25La0.75Ti3O12 (BLT) films were grown by pulsed-laser deposition on n-GaN/Al2O3(0001) substrates. X-ray θ–2θ, rocking curve measurements and φ-scans revealed the degree of crystallinity and epitaxiality. The full width at half maximum for (028) BLT deposited on GaN was 0.93° due to multi-orientational states. Surface chemical bonding states of as-deposited and etched films were recorded by X-ray photoelectron spectroscopy. The remanent polarization and coercive field of the Au/BLT/n–GaN/Al2O3(0001) structure were 22 μC/cm2 and 150 kV/cm, respectively.

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