Dynamic Behavior of Tungsten Surfaces due to Simultaneous Impact of Hydrogen and Carbon Ion Beam

Search this article

Abstract

By using a simulation code for ion-solid interactions, EDDY, the dynamical behavior of W surfaces irradiated simultaneously with H+ and C+ impurity has been studied. This code models the fluence evolution of composition changes between C and W at the irradiated surface, which results from sputtering erosion and impurity deposition. The result has been described in terms of C impurity concentration in the irradiation. It has been compared with experimental data obtained by an ion beam irradiation device. In particular, the C impurity concentration has an important role in erosion/deposition at the W surface. As the C impurity concentration increases, the erosion is enhanced. As the C impurity concentration exceeds 3.00%, there is a transition from erosion to deposition which is due to the formation of a C film on the W surface. Regarding the result that the erosion changes to deposition, the simulation qualitatively reproduces the experimental results measured by X-ray photoemission spectroscopy (XPS). There is a different tendency in the fluence dependence for the different C impurity concentrations. For C:0.11%, the erosion rate increases with increasing fluence. This results from a growth of a local peak at around a depth of 20 nm in the depth profile of the deposited C. The growth is in good agreement with the experimental result, which shows that there is a strong contribution from recoil implantation of the deposited C due to a synergetic effect of the H and C impurity. For C:0.84%, there are almost the same tendencies as for C:0.11% in the erosion rate and in the depth profile. However, the growth of the local peak at around a depth of 10 nm is in disagreement with the measured one, which occurs near the surface. The disagreement appears to be attributable to the contribution of the surface segregation.

Journal

Citations (1)*help

See more

References(22)*help

See more

Details 詳細情報について

Report a problem

Back to top