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- UWATE Yoko
- Department of Dept. of Electrical and Electronics Engineering, Tokushima University Institute of Neuroinfomatics, University/ETH Zurich
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- NISHIO Yoshifumi
- Department of Dept. of Electrical and Electronics Engineering, Tokushima University
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- STOOP Ruedi
- Institute of Neuroinfomatics, University/ETH Zurich
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説明
Durability describes the ability of a device to operate properly in imperfect conditions. We have recently proposed a novel neural network structure called an “Affordable Neural Network” (AfNN), in which affordable neurons of the hidden layer are considered as the elements responsible for the robustness property as is observed in human brain function. Whereas earlier we have shown that AfNNs can still generalize and learn, here we show that these networks are robust against damages occurring after the learning process has terminated. The results support the view that AfNNs embody the important feature of durability. In our contribution, we investigate the durability of the AfNN when some of the neurons in the hidden layer are damaged after the learning process.
収録刊行物
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- IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
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IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences E92-A (2), 585-593, 2009
一般社団法人 電子情報通信学会
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詳細情報 詳細情報について
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- CRID
- 1390282681286577280
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- NII論文ID
- 10026855913
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- NII書誌ID
- AA10826239
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- ISSN
- 17451337
- 09168508
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
- OpenAIRE
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- 抄録ライセンスフラグ
- 使用不可