Discrimination of a Resistive Open Using Anomaly Detection of Delay Variation Induced by Transitions on Adjacent Lines
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- YOTSUYANAGI Hiroyuki
- Graduate School of Science and Technology, Tokushima University
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- ISE Kotaro
- Graduate School of Science and Technology, Tokushima University
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- HASHIZUME Masaki
- Graduate School of Science and Technology, Tokushima University
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- HIGAMI Yoshinobu
- Graduate School of Science and Engineering, Ehime University
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- TAKAHASHI Hiroshi
- Graduate School of Science and Engineering, Ehime University
Description
<p>Small delay caused by a resistive open is difficult to test since circuit delay varies depending on various factors such as process variations and crosstalk even in fault-free circuits. We consider the problem of discriminating a resistive open by anomaly detection using delay distributions obtained by the effect of various input signals provided to adjacent lines. We examined the circuit delay in a fault-free circuit and a faulty circuit by applying electromagnetic simulator and circuit simulator for a line structure with adjacent lines under consideration of process variations. The effectiveness of the method that discriminates a resistive open is shown for the results obtained by the simulation.</p>
Journal
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- IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
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IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences E100.A (12), 2842-2850, 2017
The Institute of Electronics, Information and Communication Engineers
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Details 詳細情報について
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- CRID
- 1390282681291678848
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- NII Article ID
- 130006236547
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- ISSN
- 17451337
- 09168508
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- Text Lang
- en
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- Data Source
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- JaLC
- Crossref
- CiNii Articles
- OpenAIRE
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- Abstract License Flag
- Disallowed