Relationship between resolution and rotation stage in imaging X-ray CT
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- Kobayashi Masakazu
- Department of Mechanical Engineering, Toyohashi University of Technology
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- Sugihara Yoshihiko
- Department of Mechanical Engineering, Toyohashi University of Technology
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- Toda Hiroyuki
- Department of Mechanical Engineering, Toyohashi University of Technology
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- Uesugi Kentaro
- Japan Synchrotron Radiation Research Institute
Bibliographic Information
- Other Title
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- 結像型X線CTにおける回転ステージと分解能の関係
- ケツゾウガタ Xセン CT ニ オケル カイテン ステージ ト ブンカイノウ ノ カンケイ
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Description
In this study, evaluation of precision in rotation stage and investigation of effect of rotation stage blurring on resolution are performed in imaging X-ray tomography set-up, which allows nano-scale observation, for the purpose of improving resolution in X-ray tomography. In the result of precision evaluation of rotation stage in high-resolution imaging X-ray tomography, fluctuation, which was approximately 35 nm in maximum and approximately 13 nm in average, was found. This fluctuation was under 1 pixel. In the simulation that analyzed effect of fluctuation in rotation stage, it was found that long periodic fluctuation deteriorate reconstructed image terribly. But, impulse-like fluctuation does not almost affect reconstructed image quality. However, reconstructed image is deteriorated when the frequency of impulse-like fluctuation increase. If long periodic fluctuation, which was observed in the precision evaluation, is corrected, the resolution improvement was confirmed though the fluctuation was less than 1 pixel.
Journal
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- Journal of Japan Institute of Light Metals
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Journal of Japan Institute of Light Metals 63 (8), 273-278, 2013
The Japan Institute of Light Metals
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Details 詳細情報について
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- CRID
- 1390282681316437504
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- NII Article ID
- 130004775035
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- NII Book ID
- AN00069773
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- ISSN
- 18808018
- 04515994
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- NDL BIB ID
- 024782615
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- Crossref
- CiNii Articles
- OpenAIRE
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- Abstract License Flag
- Disallowed