Examination of an Imaging Method in Early Alzheimer Disease Diagnosis Support System (VSRAD)

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  • Goto Masami
    Department of Radiological Technology, University of Tokyo Hospital
  • Aoki Shigeki
    Department of Radiology, University of Tokyo Hospital
  • Abe Osamu
    Department of Radiology, University of Tokyo Hospital
  • Masumoto Tomohiko
    Department of Radiological Technology, University of Tokyo Hospital
  • Watanabe Yasushi
    Department of Radiological Technology, University of Tokyo Hospital
  • Satake Yoshiroh
    Department of Radiological Technology, University of Tokyo Hospital
  • Nishida Katsuji
    Department of Radiological Technology, University of Tokyo Hospital
  • Ino Kenji
    Department of Radiological Technology, University of Tokyo Hospital
  • Yano Keiichi
    Department of Radiological Technology, University of Tokyo Hospital
  • Iida Kyohhito
    Department of Radiological Technology, University of Tokyo Hospital
  • Mima Kazuo
    Department of Radiological Technology, University of Tokyo Hospital
  • Ohtomo Kuni
    Department of Radiology, University of Tokyo Hospital

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Other Title
  • 早期アルツハイマー型痴呆診断支援システム（ＶＳＲＡＤ）における撮像方法の検討
  • ソウキ アルツハイマーガタ チホウ シンダン シエン システム VSRAD ニ オケル サツゾウ ホウホウ ノ ケントウ

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Abstract

The use of voxel-based morphometry (VBM) has recently become a popular tool for the early diagnosis of Alzheimer disease. The Voxel-Based Specific Regional Analysis System for Alzheimer's Disease (VSRAD) is a clinically useful VBM that employs MRI. However, there has been insufficient information about the influence of the image pickup apparatus and imaging conditions in terms of the value calculated by the sensitivity correction. We therefore reviewed this problem in a volunteer who provided consent. We were able to confirm reproducibility under the same conditions. When changing the image pickup apparatus and conditions, the average Z-score of 0.18±0.21 became larger, and the change in Z-score increased when imaging was done in the axial plane. Further, the average Z-score of 0.06±0.21 for sensitivity correction use was high on average by 0.19±0.16 for phased-array uniformity enhancement (PURE) and low for surface coil intensity correction (SCIC).

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