高純度ゲルマニウム半導体検出器を用いて測定したX線スペクトルの補正計算コードの開発

  • 加藤 秀起
    エスエス技研株式会社
  • 津坂 昌利
    名古屋大学医療技術短期大学部診療放射線技術学科
  • 小山 修司
    名古屋大学医療技術短期大学部診療放射線技術学科
  • 前越 久
    名古屋大学医療技術短期大学部診療放射線技術学科

書誌事項

タイトル別名
  • DEVELOPMENT OF COMPUTER CODE FOR CORRECTION OF X-RAY SPECTRA MEASURED WITH HIGH-PURITY GERMANIUM DETECTORS

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説明

The X-ray spectrum, measured by a high-purity germanium (HP-Ge) semiconductor detector, is the spectrum of energy absorbed in the germanium crystal. Therefore, to obtain the incident X-ray spectrum to the detector, the output spectral data from the detector must be corrected considering the energy-dependent response of the detector. The response of a HP-Ge detector to incident photon beams depends on the shape and size of the crystal and the geometry of measurement such as the photon incident angle to the detector. Accordingly, if the response data, which were used for the correction of measured spectrum, dose not correspond to the factors of measurement, the incident spectrum can not be obtained correctly. We have developed a computer code, SPECX, for correction of output spectral data measured by a HP-Ge detector. Using this code, the incident X-ray spectrum to the detector can be obtained from the output spectral data measured by any shape and size of the HP-Ge crystal and any geometry of measurement.

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