Structural Analysis of Native Passive Films on Stainless Steels Using Synchrotron X-ray Spectroscopy

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Other Title
  • 放射光X線分光を駆使したステンレス鋼表面における自然不動態被膜の構造解析
  • ホウシャコウ Xセン ブンコウ オ クシ シタ ステンレスコウ ヒョウメン ニ オケル シゼン フドウタイ ヒマク ノ コウゾウ カイセキ

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Abstract

<p>A native passive film is formed on the SUS304 surface at ordinary temperature and pressure1, 2). As a structural model of the film, a network-structure composed of Cr-oxide and -hydroxide has ever been proposed1, 3), but experimental evidences for the structure have not been reported yet. We examined the detailed film structure using synchrotron X-ray absorption fine structure (XAFS) and X-ray photoelectron spectroscopy (XPS). The XAFS spectra clearly showed an ordered network-structure (at least < 10 Å) of Cr(IV) oxide. Additionally, the XPS spectra indicated that the chromium oxide is transformed into a chromium oxyhydroxide such as a -O-Cr-OH- structure. These results are the first evidence that the network structure exists actually in the native passive film of SUS304.</p>

Journal

  • Hyomen Kagaku

    Hyomen Kagaku 37 (9), 422-428, 2016

    The Surface Science Society of Japan

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