書誌事項
- タイトル別名
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- Electron Microscopy for “Nano-in-Macro”
- シュウサ ホセイ デンシ ケンビキョウ ト ヒョウメン ・ カイメン カガク
- Electron Microscopy for ^|^ldquo;Nano-in-Macro^|^rdquo;
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抄録
Aberration corrected electron microscopy has revealed various aspects of materials and their functions, i.e., interfacial, ionic, chemical, photonic, plasmonic, magnetic and electronic aspects. A 50 pm resolution microscopy, particularly, enabled us to observe lithium ions in LiMn2O4, a material used as lithium ion battery electrodes. The 50 pm electron probe scanning over the surface is sensitive enough to detect a single adatom/vacancy similarly to STM. The 50 pm microscopy, in transmission mode of observation, is useful for study of catalysis, as demonstrated for Au/TiO2 in O2 and/or CO environment. Aberration corrected in-situ electron microscopy provides atomic, ionic, and electronic properties, in relation to structures at “nano in macro”.
収録刊行物
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- 表面科学
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表面科学 34 (5), 226-233, 2013
公益社団法人 日本表面科学会
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詳細情報 詳細情報について
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- CRID
- 1390282681434518272
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- NII論文ID
- 10031170835
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- NII書誌ID
- AN00334149
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- COI
- 1:CAS:528:DC%2BC3sXhsFSktr%2FP
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- ISSN
- 18814743
- 03885321
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- NDL書誌ID
- 024664119
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
- KAKEN
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- 抄録ライセンスフラグ
- 使用不可