放射光励起走査トンネル顕微鏡による高分解能元素分析イメージング

DOI Web Site Web Site 参考文献16件

書誌事項

タイトル別名
  • Scanning Tunneling Microscopy Assisted by Synchrotron Radiation Light for High-resolution Element Specific Imaging
  • ホウシャ コウ レイキ ソウサ トンネル ケンビキョウ ニ ヨル コウ ブンカイノウ ゲンソ ブンセキ イメージング

この論文をさがす

抄録

Microscope having atomic resolution with chemical sensitivity is one of the ultimate microscopes for the material science. Scanning tunneling microscope (STM) assisted by the core-level excitation by synchrotron radiation (SR) may be a possible candidate of such an ultimate microscope. In this paper we will demonstrate that we can observe element specific images of surfaces in the spatial resolution of several tens of nanometer by measuring the photon induced current images taken with an STM tip detecting the secondary electrons produced by the electron-hole recombination after the core-level excitation. Importance of the chemical contrast-enhancement by dividing the SR-STM image taken at photon absorption edge top by that of at the edge bottom is demonstrated by the observation of transition metal micro patterns. Possibility of a nanometer scale chemical imaging such as C60 domain structure on Si(111)√3×√3-Ag surface with an assistance of high-brilliant light sources is also suggested.

収録刊行物

  • 表面科学

    表面科学 31 (9), 452-458, 2010

    公益社団法人 日本表面科学会

参考文献 (16)*注記

もっと見る

関連プロジェクト

もっと見る

キーワード

詳細情報 詳細情報について

問題の指摘

ページトップへ