Wide-bandgap Semiconductor Devices using Group-III Nitride/SiC Heterointerface
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- SUDA Jun
- Department of Electronic Science and Engineering, Kyoto University
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- MIYAKE Hiroki
- Department of Electronic Science and Engineering, Kyoto University
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- KIMOTO Tsunenobu
- Department of Electronic Science and Engineering, Kyoto University Photonic and Electronics Science and Engineering Center, Kyoto University
Bibliographic Information
- Other Title
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- III族窒化物/SiCヘテロ界面を用いたワイドギャップ半導体デバイス
- 3族窒化物/SiCヘテロ界面を用いたワイドギャップ半導体デバイス
- 3ゾク チッカブツ SiC ヘテロ カイメン オ モチイタ ワイドギャップ ハンドウタイ デバイス
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Abstract
This paper describes group-III nitride (III-N)/SiC heterointerface and its device applications. Heteroepitaxial growth of III-N on SiC opens new opportunity of SiC-based heterojunction devices such as heterojunction bipolar transistors (HBTs). The authors developed growth methods to grow high-quality III-N on SiC by molecular-beam epitaxy. Fabricated GaN/SiC heterojunction exhibited type-II band-lineup. By using AlN/GaN short period superlattice as a quasi AlGaN alloy, the authors successfully controlled the band-lineup to be type-I and demonstrated common-emitter-mode operation of III-N/SiC HBTs.
Journal
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- Hyomen Kagaku
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Hyomen Kagaku 31 (12), 651-656, 2010
The Surface Science Society of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390282681435419008
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- NII Article ID
- 10027573922
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- NII Book ID
- AN00334149
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- ISSN
- 18814743
- 03885321
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- NDL BIB ID
- 10934859
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed