Atomic Force Microscopy for Visualization of Submolecular Structures
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- K. SHIMIZU Tomoko
- National Institute for Materials Science JST-PRESTO
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- CUSTANCE Oscar
- National Institute for Materials Science
Bibliographic Information
- Other Title
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- 分子の内部構造を見る原子間力顕微鏡技術
- ブンシ ノ ナイブ コウゾウ オ ミル ゲンシ カンリョク ケンビキョウ ギジュツ
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Description
<p>Recent advances in non-contact atomic force microscopy (NC-AFM) allow us to visualize structural frameworks of small organic molecules. So far, metallic probes mounted on a stiff piezoelectric sensor in a qPlus configuration and functionalized with a CO molecule have been mostly used to observe relatively flat molecules that are adsorbed parallel to the surface. We have developed a new method that is capable of imaging 3D molecules and surface systems using a so-called multi-pass routine. This imaging method can be used with commercial Si cantilevers to obtain submolecular resolution under less demanding conditions compared to the CO-functionalized probe. In this report, we describe technical points, theoretical interpretation of image contrast, and examples of multi-pass images. A comparison with the previous method is also given to better understand our newly developed technique.</p>
Journal
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- Hyomen Kagaku
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Hyomen Kagaku 37 (7), 320-325, 2016
The Surface Science Society of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390282681435664640
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- NII Article ID
- 130005165552
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- NII Book ID
- AN00334149
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- ISSN
- 18814743
- 03885321
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- NDL BIB ID
- 027543652
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed