Spectrographic Analysis of Tantalum Ores and Related Materials

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  • タンタル鉱石および関連物質の定量分光分析法
  • タンタル コウセキ オヨビ カンレン ブッシツ ノ テイリョウ ブンコウ ブンセキホウ

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Abstract

Recent developments in the tantalum refining industry have demanded a handy method of analyzing tantalum ores and related materials such as intermediates, and residues, for the control and improvement of the refining processes. By use of a medium quartz spectrograph the authors studied a spectrographic analytical method of these materials, in which the sample was fused with a fusion flux, powdered, and then sparked with a Feussner spark source. As the result, a method suitable for routine analysis was established. The factors investigated in the experiments were the fusion flux, amount of the flux to be added, fusion time, analytical gap, shape of the electrode, particle size and quantity of the sample to be fused, particle size of the fused sample to be sparked, analytical line pairs, and errors due to the sample preparation and the analysis. The outline of the method obtained was as follows: A mixture of 100 mg of finely ground sample and 50 mg of GeO2 added as an internal standard is carefully fused with 1.5 g of KHSO4, the resultant melt is cooled and pulverized to 180 mesh, loaded into a cup-electrode, and sparked with a graphite counter electrode sharpened to a truncated cone. The standard samples are prepared from synthetic oxides by applying the same fusion treatment as described above. In the various tantalum ores and related materials, Ta, Nb, Fe, Mn, Sn, Ca, Si, Ti, Al, Cr and Mg were determined over the range 0.05∼100% with a variation coefficient of 3∼5%, and good agreement was shown between the chemical and the spectrographic results.

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