溶融Na2O-TiO2-SiO2系珪酸塩の赤外線発光分光

草開 清志, 白石 裕

doi:10.2320/jinstmet1952.45.3_259

In order to elucidate the behavior of TiO₂ in the silicate melt which is well known as amphoteric oxide, infrared emission spectra were measured in the molten state of the Na₂O-TiO₂-SiO₂ system and were compared with the spectra measured in the glassy state including Raman scattering. The results obtained from the in situ measurement are as follows: (1) Since the spectrum patterns in molten states are almost similar to those in glassy states, it is concluded that there is no essential difference in the silicate anions in the molten or glassy state. (2) When TiO₂ is added to sodium silicates, two bands appear at 57000 and 33500 m⁻¹. The intensities of these bands increase proportionally with the TiO₂ content. They are assigned to the stretching mode (F_1u) and the bending mode (F_1u) of TiO₆⁸⁻ structure belonging to the point group symmetry O_h. Therefore, it is recognized that the Ti⁴⁺ ion takes the octahedrally coordinated oxygens in the silicates. (3) The ratio of the area of the Si-O⁻ (NBO) band to that of the total Si-O⁻ (NBO) and Si-O (BO) bands increases with increasing Na₂O or TiO₂ content in the melt. Therefore, it is concluded that both TiO₂ and Na₂O act as strong network modifiers in the silicate melt within the composition range measured.

溶融Na<SUB>2</SUB>O-TiO<SUB>2</SUB>-SiO<SUB>2</SUB>系珪酸塩の赤外線発光分光

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