Evaluation and Correction of EDS Results of the Glass Shards from Some Representative Tephra by Comparison with XRF Analysis

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  • ＸＲＦ分析との比較によるテフラガラス片のＥＤＳ分析結果の評価と補正
  • XRF ブンセキ ト ノ ヒカク ニ ヨル テフラガラスヘン ノ EDS ブンセキ ケッカ ノ ヒョウカ ト ホセイ

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Major element chemistry of glass shards collected from representative tephra layers (B-Og, Aso-1, Km4, Oga and AT tephra layers and Ikezuki tuff) as glass standard reference materials was determined by X-ray fluorescence spectrometry (XRF) and energy dispersive X-ray spectrometry (EDS). The mean compositions of the standard glass by XRF analysis have SiO2 contents in the range of 65-78wt.%, recalculated on a volatile-free basis. The reproducibility of the EDS analysis was treated by a coefficient of variation plotted against the EDS analytical content on each element. The accuracy of the EDS results, plotted against XRF results for each element, have been evaluated in comparison with the XRF results as a standard. Least-squares fitting was applied to the data points. Furthermore, the raw analytical results by the EDS were corrected by using a coefficient of the linear function. The corrected EDS result obtained is consistent with the chemistry of identical tephra glass shards found by previous workers. The corrected EDS results agree with those obtained using the same procedure at an other institute, in spite of the different apparatus and configuration of the EDS system. Consequently our proposed procedure of the EDS analysis and correction is widely available for identification and correlation of tephra layers.

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