Chemical Mapping of Cell Wall Components

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  • 細胞壁構成成分のケミカルマッピング
  • サイボウヘキ コウセイ セイブン ノ ケミカルマッピング

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Abstract

Time of flight secondary ion mass spectrometry (TOF-SIMS) is a rapidly developing technique that provides chemical information about the solid sample surface and does not need any pretreatments. The significant advantage of TOF-SIMS over other methods is the direct visualization of many organic/inorganic chemicals on the sample surface with submicron lateral resolution. Here, the applications of TOF-SIMS to wood science are reviewed.<br>Plant cell wall consists of three major polymers (cellulose, hemicellulose, and lignin) and many other inorganic and low-molecular-weight organic chemicals. Usually, the polymer components are detected as fragment ions in the TOF-SIMS measurement. The fragmentation behaviors of the polymers are essential to discuss the original structure so that the behavior is described. Especially, the behavior of lignin is described in detail. Subsequently, several results on the relative amounts and the chemical structure of the lignin in specific plant tissues are discussed. A report using TOF-SIMS to discriminate the indistinguishable sapwood from heartwood in discolored ancient wood material is also introduced.<br>The recent advances in cryo-TOF-SIMS are described. Cryo-TOF-SIMS can deal with a frozen-hydrated sample and is a powerful approach to visualize water-soluble chemicals of nearly equal distribution in a living system. At last, results on pulp and paper chemistry using (cryo-) TOF-SIMS are described briefly.

Journal

  • JAPAN TAPPI JOURNAL

    JAPAN TAPPI JOURNAL 70 (3), 308-315, 2016

    JAPAN TECHNICAL ASSOCIATION OF THE PULP AND PAPER INDUSTRY

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