エンジニアリングプラスチック‐合成技術と応用技術の新展開 ポリエチレンナフタレートの延伸過程における構造形成 IPシステムを用いた動的X線測定

書誌事項

タイトル別名
  • Engineering Plastics-Recent Developments in Synthesis and Applications. Structure Formation in the Drawing Process of Poly(ethylene-2,6-naphthalate).
  • ポリエチレン ナフタレート ノ エンシン カテイ ニ オケル コウゾウ ケイセ
  • IPシステムを用いた動的X線測定

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抄録

The structure formation and/or change in the uniaxial drawing process of an unoriented amorphous film of poly- (ethylene 2, 6-naphthalate) (PEN) was studied using X-ray diffraction apparatus which we had developed together with an IP recording system. Deformation of polymer is accompanied by stress relaxation. Therefore, the structural measurement during the deformation is highly desirable and necessary to elucidate the structure formation and/or change. The apparatus allows us to record a time-resolved series of two-dimensional wide-angle X-ray diffraction patterns. When an unoriented amorphous PEN film was drawn above Tg (117°C), for example at 150°C, the film showed the orientation up to the yield point (DR=1.8) in spite of the fact that the film remained amorphous. When the film was drawn beyond the yield point, the stress suddenly decreased and necking of the film was observed here. During this necking, the chain axis oriented along the drawing direction and crystallization started. Equatorial 010, 100, 110 reflection became stronger and sharper, and showed a fiber structure pattern (transverse isotropy). These reflections were accompanied by streaks on the off-equatorial layer line. These streaks suggested a paracrystalline state, which came from disorder by the axial shift of polymer chains in the direction of chain axis. In the further drawing, 110 reflection disappeared and the film showed ‘double orientation’ (uniplanar axial orientation (110) [001]) with the (110) lattice planes parallel to the film surface. Thus, we have elucidated double orientation in amorphous PEN on necking by the uniaxial drawing above Tg.

収録刊行物

  • 高分子論文集

    高分子論文集 54 (4), 183-198, 1997

    公益社団法人 高分子学会

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