書誌事項
- タイトル別名
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- Specimen heating holder for high temperature high resolution transmission electron microscopy and its application.
- コウ ブンカイノウ デンシ ケンビキョウヨウ シリョウ カネツ ソウチ ト ソノ オウヨウ
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抄録
In situ electron microscope observation is a very useful technique to observe directly structural changes of materials. A direct heating type hot stage for use with a high resolution transmission electron microscope has been developed. The hot stage allows high resolution transmission electron microscopy observation at high temperatures above 1000°C. This paper describes the performance of the hot stage and its application to a study of a formation and sintering of SiC crystals at 1500°C. SiC crystal growth during sintering was observed at near atomic resolution.
収録刊行物
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- 岩石鉱物科学
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岩石鉱物科学 29 (4), 150-155, 2000
一般社団法人 日本鉱物科学会
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詳細情報 詳細情報について
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- CRID
- 1390282681501596544
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- NII論文ID
- 10004814191
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- NII書誌ID
- AA1146088X
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- COI
- 1:CAS:528:DC%2BD3cXovFKks7c%3D
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- ISSN
- 13497979
- 1345630X
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- NDL書誌ID
- 5685423
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可