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- KAWAMURA Takaaki
- Physics Institute, Faculty of Education and Liberal Arts, Yamanashi University
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- HOSOYA Sukeaki
- Institute for Solid State Physics, University of Tokyo
Bibliographic Information
- Other Title
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- EXAFSの理論新しい局所構造決定法の特徴と問題点
- EXAFS ノ リロン アタラシイ キョクショ コウゾウ ケッテイホウ ノ ト
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Abstract
The Fourier inversion method recently introduced to the EXAFS analyses has enabled to give the information on the local atomic arrangement around the absorbing atoms. This method, complimentary to the traditional X-ray structure analysis one, has proved to be very useful to get information about the local structure in both amorphous and crystalline materials.<BR>The present review mainly describes the followings: 1) Why is EXAFS observed?<BR>2) Why is the new method of analysis effective? 3) How to analyze the data? 4) What are the remaining difficulties? 5) What are variational methods?<BR>In view of the fact that synchrotron radiation sources with an intensive continuous X-ray spectrum soon become popular, the above method will be widely used in various fields including biophysics.
Journal
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- Seibutsu Butsuri
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Seibutsu Butsuri 19 (5), 213-222, 1979
The Biophysical Society of Japan General Incorporated Association
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Details 詳細情報について
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- CRID
- 1390282681511858816
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- NII Article ID
- 130000722989
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- NII Book ID
- AN00129693
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- ISSN
- 13474219
- 05824052
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- NDL BIB ID
- 2066355
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed