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- Sakamae Hiroshi
- 株式会社島津製作所 分析計測事業部
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- Hayashi Hiroshi
- 株式会社島津製作所 分析計測事業部
Bibliographic Information
- Other Title
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- EPMAの基礎技術と最新のFE-EPMAの紹介
- EPMA ノ キソ ギジュツ ト サイシン ノ FE-EPMA ノ ショウカイ
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Description
<p>In recent years SEM-EDS has become a very friendly and useful surface analysis device by its technological innovation, but it is thought that EPMA (here, this word means “Electron probe microanalyzer with WDS” contrasted with SEM-EDS) which has low minimum detection limit and superior quantitative precision will continue to be used as the surface analysis device which is indispensable in solving problems in various fields. Particularly in late years the space resolving power of the element mapping image was remarkably improved by appearance of the EPMA with FE electron gun (FE-EPMA), so the application range of EPMA is rather spreading. In order to deepen understanding about EPMA, this lecture gives brief explanation about the difference between EPMA and SEM-EDS first, then describes characteristic performance and function of EPMA and shows one of applications with latest FE-EPMA.</p>
Journal
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- KENBIKYO
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KENBIKYO 50 (1), 61-66, 2015-04-30
The Japanese Society of Microscopy
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Details 詳細情報について
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- CRID
- 1390282752322463744
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- NII Article ID
- 130007701750
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- NII Book ID
- AA11917781
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- ISSN
- 24342386
- 13490958
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- NDL BIB ID
- 026555192
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- CiNii Articles
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- Abstract License Flag
- Disallowed