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- WAKAHARA Akihiro
- Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology
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- YAMANE Keisuke
- Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology
Bibliographic Information
- Other Title
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- Si基板に格子整合したIII‐V‐N混晶の成長とデバイス応用
- Si基板に格子整合したⅢ-V-N混晶の成長とデバイス応用
- Si キバン ニ コウシ セイゴウ シタ Ⅲ-V-Nコンショウ ノ セイチョウ ト デバイス オウヨウ
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Abstract
<p>This paper presents key technologies for III‐V/Si heteroepitaxy and its device applications, including the control of a hetero-valent interface, growth of lattice-matched III‐V‐N alloys and doping control of the alloys. Two-dimensional growth of the GaP layer at the initial growth stage on a Si substrate has an important role to suppress the generation of structural defects such as anti-phase domains, stacking faults and melt-back etching. For the successful growth of III‐V‐N alloys, the impact of temperature, nitrogen-composition and the V/III ratio on the crystallinity should be taken into account. The additional understanding of III‐V/Si hetero-epitaxy obtained from our study will be informative for its various applications based on III‐V materials integration with Si.</p>
Journal
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- Oyo Buturi
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Oyo Buturi 87 (7), 494-500, 2018-07-10
The Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1390282752331569536
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- NII Article ID
- 130007715817
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- NII Book ID
- AN00026679
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- ISSN
- 21882290
- 03698009
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- NDL BIB ID
- 029147238
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- CiNii Articles
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- Abstract License Flag
- Disallowed