GaN field-effect transistor for terahertz wave detection
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- ONISHI Toshikazu
- Semiconductor Device Development Center, Industrial Device Company, Panasonic Corporation
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- TAKIGAWA Shinichi
- Semiconductor Device Development Center, Industrial Device Company, Panasonic Corporation
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- OTSUJI Taiichi
- Research Institute of Electrical Communication, Tohoku University
Bibliographic Information
- Other Title
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- テラヘルツ波検出GaNトランジスタの開発
- テラヘルツハ ケンシュツ GaN トランジスタ ノ カイハツ
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Description
<p>A terahertz (THz) detector that uses plasmon resonance in the field-effect transistor has attracted considerable attention as a compact and room-temperature-operating device applicable to various fields, such as security imaging and material analysis. We have developed a room-temperature terahertz detector with high responsivity by using gallium nitride, which can increase the intensity of plasmon resonant response, as well as by designing the electrodes as a dipole antenna of an incoming THz electromagnetic wave.</p>
Journal
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- Oyo Buturi
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Oyo Buturi 81 (6), 506-510, 2012-06-10
The Japan Society of Applied Physics
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Keywords
Details 詳細情報について
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- CRID
- 1390282752337419904
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- NII Article ID
- 10030595051
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- NII Book ID
- AN00026679
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- ISSN
- 21882290
- 03698009
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- NDL BIB ID
- 023822715
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- CiNii Articles
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- Abstract License Flag
- Disallowed