Application of Cross Section Polisher to Sample Preparation for Surface Analysis

DOI Web Site Web Site 1 Citations Open Access

Bibliographic Information

Other Title
  • クロスセクションポリッシャーの表面分析用断面試料作製への応用
  • クロス セクション ポリッシャー ノ ヒョウメン ブンセキヨウ ダンメン シリョウ サクセイ エノ オウヨウ

Search this article

Description

<p>  Sample preparation techniques are absolutely important for structural analysis. Widely used techniques such as mechanical polishing and microtome fabrication have proved to be highly effective techniques. However, these techniques have severe limitations regarding fabrication of hard materials, and obtaining wide useful observation areas, which make the fabrication of particularly composite layered materials extremely difficult. To alleviate these difficulties a recently developed broad argon ion beam Cross Section Polisher (CP) was used to fabricate various composite materials. The application of CP requires an elaborate and skillful sample pre-treatment that is unique to the nature of each sample and which enhances the possibility of a wide variety of surface analysis methods to be applied to the sample. In this paper we introduce typical examples of the application of CP as a sample preparation technique for surface analysis.</p>

Journal

Citations (1)*help

See more

Details 詳細情報について

Report a problem

Back to top