Evaluation of Electron-emitting Film for Spacecraft Charging Mitigation (ELFs Charm)
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- TANAKA Atomu
- Kyushu Institute of Technology (Kyutech)
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- MATEO VELEZ Jean-Charles
- Office National d'Etudes et de Recherches Aérospatiales (ONERA)
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- DADOUCH Sarah
- Office National d'Etudes et de Recherches Aérospatiales (ONERA)
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- OKUMURA Teppei
- Japan Aerospace Exploration Agency (JAXA)
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- SAKAMOTO Kenji
- Kyushu Institute of Technology (Kyutech)
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- IWATA Minoru
- Kyushu Institute of Technology (Kyutech)
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- TOYODA Kazuhiro
- Kyushu Institute of Technology (Kyutech)
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- CHO Mengu
- Kyushu Institute of Technology (Kyutech)
Description
<p>To protect a satellite from accidents due to spacecraft charging, Kyushu Institute of Technology (Kyutech) is developing a device called ELFs-Charm, which stands for ELectron-emitting Film for Spacecraft CHARging Mitigation. Electron emission from ELFs-Charm was already confirmed in Polar Earth Orbit in 2012 via flight experiment onboard HORYU-II. As a next step, we are considering the practical operation for spacecraft charging mitigation. The present emission level is not enough to increase the satellite potential. We focus our efforts on improving two properties, charging property and the emission threshold. The charging property is measured by how well the differential voltage between the ELFs-charm insulator surface and the satellite chassis increases. The emission threshold is measured by the differential voltage when the electron emission starts. This paper reports the laboratory experimental results to measure the two properties of various samples. The sample made of fluorin resin coating had a good combination of the charging property and the emission threshold that makes it possible to emit electron under realistic ambient electron current density in orbit.</p>
Journal
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- TRANSACTIONS OF THE JAPAN SOCIETY FOR AERONAUTICAL AND SPACE SCIENCES, AEROSPACE TECHNOLOGY JAPAN
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TRANSACTIONS OF THE JAPAN SOCIETY FOR AERONAUTICAL AND SPACE SCIENCES, AEROSPACE TECHNOLOGY JAPAN 17 (1), 1-6, 2019
THE JAPAN SOCIETY FOR AERONAUTICAL AND SPACE SCIENCES
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Keywords
Details 詳細情報について
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- CRID
- 1390282763083970048
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- NII Article ID
- 130007542851
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- ISSN
- 18840485
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- Text Lang
- en
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- Data Source
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- JaLC
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed