Development of An <i>In-Situ</i> Straining and Tomography System in TEM

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  • TEM内その場変形トモグラフィー観察システムの開発
  • TEM ナイ ソノ バ ヘンケイ トモグラフィー カンサツ システム ノ カイハツ

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Abstract

<p>We have developed a unique methodology and a new hardware/software-integrated system for in-situ straining and electron tomography (ET) experiments. The central software of the system controls a straining-and-tomography specimen holder, imaging devices and the specimen stage of a transmission electron microscope (TEM) in an integrated manner. Using the system, one can perform in-situ time-resolved three-dimensional (3D) studies that explore in real-time and at sub-microscopic levels the internal behavior of materials subjected to external stresses. 3D visualization of a Pb–Sn solder alloy thin foil’s deformation dynamics by iterative step-wise stress loading and tilt-series data sets acquisition is introduced as an application of the system.</p>

Journal

  • KENBIKYO

    KENBIKYO 54 (1), 44-48, 2019

    The Japanese Society of Microscopy

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