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Visualization of Substrate by Means of X-ray, and Solutions for Issues in CT Inspection
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- Noguchi Kenji
- FA Inspection Equipment Company, Nagoya Electric Works Co.,Ltd.
Bibliographic Information
- Other Title
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- X線による実装基板の可視化とCT検査の課題解決について
- Xセン ニ ヨル ジッソウ キバン ノ カシカ ト CT ケンサ ノ カダイ カイケツ ニ ツイテ
- Published
- 2019-07-01
- DOI
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- 10.5104/jiep.22.275
- Publisher
- The Japan Institute of Electronics Packaging
Search this article
Journal
-
- Journal of The Japan Institute of Electronics Packaging
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Journal of The Japan Institute of Electronics Packaging 22 (4), 275-278, 2019-07-01
The Japan Institute of Electronics Packaging
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Details 詳細情報について
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- CRID
- 1390282763126800640
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- NII Article ID
- 130007672068
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- NII Book ID
- AA11231565
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- ISSN
- 1884121X
- 13439677
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- NDL BIB ID
- 029872101
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- Crossref
- CiNii Articles