Moire Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales
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- Wang Qinghua
- Research Institute for Measurement and Analytical Instrumentation, National Institute of Advanced Industrial Science and Technology
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- Tsuda Hiroshi
- Research Institute for Measurement and Analytical Instrumentation, National Institute of Advanced Industrial Science and Technology
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- Kishimoto Satoshi
- Hybrid Materials Unit, National Institute for Materials Science
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- Tanaka Yoshihisa
- Hybrid Materials Unit, National Institute for Materials Science
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- Kagawa Yutaka
- Hybrid Materials Unit, National Institute for Materials Science Research Center for Advanced Science and Technology, The University of Tokyo
書誌事項
- タイトル別名
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- Moiré Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales
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説明
<p>This paper presents two up-to-date moiré techniques for deformation measurement based on the memory function of a laser scanning microscope (LSM). The two techniques are the LSM overlapping moiré method and the LSM secondary moiré method. The formation principles and the measurement principles of these two methods are presented and compared to those of the traditional scanning moiré method for the first time. The applicable conditions and characteristics of these three moiré techniques are analyzed. Some typical moiré fringes on a strain gauge, carbon fiber reinforced plastics, a polyimide film, and a silicon wafer are illustrated. Our proposed LSM overlapping moiré method and LSM secondary moiré method are able to expand the application range of the LSM in deformation measurement to the micron and the submicron scales.</p>
収録刊行物
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- International Journal of Automation Technology
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International Journal of Automation Technology 9 (5), 494-501, 2015-09-05
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