Design and Development of Electrostatically Driven Uniaxial Tensile Test Device for Silicon Nanowires

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Details 詳細情報について

  • CRID
    1390283687150282752
  • DOI
    10.18494/sam.2016.1282
  • ISSN
    24350869
    09144935
  • Text Lang
    en
  • Article Type
    journal article
  • Data Source
    • JaLC
    • Crossref
    • KAKEN
    • OpenAIRE

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