Severe Plastic Deformation under High Pressure: Upsizing Sample Dimensions
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- Horita Zenji
- Graduate School of Engineering, Kyushu Institute of Technology Magnesium Research Center, Kumamoto University Synchrotron Light Application Center, Saga University
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- Tang Yongpeng
- Graduate School of Engineering, Kyushu Institute of Technology WPI, International Institute for Carbon-Neutral Energy Research (WPI-I2CNER), Kyushu University
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- Masuda Takahiro
- Department of Mechanical Engineering and Materials Science, Yokohama National University
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- Takizawa Yoichi
- Technology Department, Nagano Forging Co., Ltd.
Bibliographic Information
- Other Title
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- 高圧下での巨大ひずみ加工:大量素材の製造に向けて
- Severe plastic deformation under high pressure for enhanced properties of materials: upsizing sample dimensions
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Description
<p>It is well known that severe plastic deformation (SPD) produces ultrafine-grained structures in bulk metallic materials. The SPD process becomes more versatile when it is performed under high pressure as high-pressure torsion (HPT) and high-pressure sliding (HPS). Not only the grain size is more refined but also the process is applicable to hard-to-deform materials such as intermetallics, semiconductors and ceramics, leading to enhancement of functional properties as well as structural properties. The major drawback is that the sample size is small so that the applicability is limited to a laboratory scale and it is an important subject to increase the sample dimensions. This paper presents an overview describing efforts devoted thus far to deal with this upscaling issue.</p>
Journal
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- MATERIALS TRANSACTIONS
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MATERIALS TRANSACTIONS 61 (7), 1177-1190, 2020-07-01
The Japan Institute of Metals and Materials
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Details 詳細情報について
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- CRID
- 1390285300169148160
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- NII Article ID
- 130007864094
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- NII Book ID
- AA1151294X
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- ISSN
- 13475320
- 18806880
- 24337501
- 13459678
- 00214876
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- HANDLE
- 10228/00007818
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- NDL BIB ID
- 030482610
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- Text Lang
- en
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- Data Source
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- JaLC
- IRDB
- NDL Search
- Crossref
- CiNii Articles
- KAKEN
- OpenAIRE
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- Abstract License Flag
- Disallowed