Optical Nano-Artifact Metrics Using White-Light Interferometric Measurement

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  • YOSHIDA Naoki
    Yokohama National University, Institute of Advanced Sciences
  • MATSUMOTO Tsutomu
    Yokohama National University, Institute of Advanced Sciences Yokohama National University, Faculty of Environment and Information Sciences

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  • 白色干渉計を読取装置とした光学的ナノ人工物メトリクス
  • ハクショク カンショウケイ オ ヨミトリ ソウチ ト シタ コウガクテキ ナノ ジンコウブツ メトリクス

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Nano-artifact metrics exploits the unique physical attributes of nanostructured matter for authentication. The crucial point is how to read and utilize nanostructured matter. This article cites work on optical nano-artifact metrics using a white-light interferometric measurement.

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