Structure analysis of τ-type molecular conductor using Synchrotron X-ray Diffraction

DOI

Bibliographic Information

Other Title
  • 放射光X線回折を用いたτ型有機伝導体の構造解析

Journal

Details 詳細情報について

  • CRID
    1390290958069776384
  • NII Article ID
    130008155556
  • DOI
    10.11316/jpsgaiyo.75.1.0_1585
  • ISSN
    21890803
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles

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