Advanced Evaluation and Analysis Techniques for Optical and Phonon Properties of Wide-gap Semiconductors

DOI

Bibliographic Information

Other Title
  • ワイドギャップ半導体の光・フォノン物性の最先端評価解析技術

Journal

Details 詳細情報について

  • CRID
    1390290958083139584
  • NII Article ID
    130008154896
  • DOI
    10.19009/jjacg.48-4-00
  • ISSN
    21878366
    03856275
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles

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