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Interpretation and Use of Mott-Schottky Plots at the Semiconductor-liquid Interfaces
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- IMANISHI Akihito
- Graduate School of Engineering Science, Osaka University
Bibliographic Information
- Other Title
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- 半導体電極界面測定におけるMott-Schottkyプロットの解釈と活用
- ハンドウタイ デンキョク カイメン ソクテイ ニ オケル Mott-Schottky プロット ノ カイシャク ト カツヨウ
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Journal
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- Journal of The Surface Finishing Society of Japan
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Journal of The Surface Finishing Society of Japan 72 (9), 479-486, 2021-09-01
The Surface Finishing Society of Japan
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Details 詳細情報について
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- CRID
- 1390291767471238400
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- NII Article ID
- 130008165425
- 40022693712
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- NII Book ID
- AN1005202X
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- ISSN
- 18843409
- 09151869
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- NDL BIB ID
- 031707693
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- Text Lang
- ja
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- Article Type
- journal article
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- Data Source
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- JaLC
- NDL Search
- Crossref
- CiNii Articles
- KAKEN
- OpenAIRE