Gate-bias dependency of the mechanisms of plasmon instabilities in a dual-grating-gate HEMT
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- HOSOTANI TOMOTAKA
- RIEC, Tohoku Univ. JSPS DC
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- Satou Akira
- RIEC, Tohoku Univ.
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- Otsuji Taiichi
- RIEC, Tohoku Univ.
Bibliographic Information
- Other Title
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- 二重回折格子状ゲートHEMTにおけるプラズモン不安定性動作機構のゲートバイアス依存性
Journal
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- JSAP Annual Meetings Extended Abstracts
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JSAP Annual Meetings Extended Abstracts 2021.1 (0), 833-833, 2021-02-26
The Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1390292472549660672
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- ISSN
- 24367613
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- Text Lang
- ja
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- Data Source
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- JaLC