Angular Dependence of Multi-atom Resonant X-ray Raman Scattering

説明

<p>We study the polarization dependence of the structure factor in multi-atom resonant X-ray Raman (MARX-Raman) scattering. The calculations for the GaN (C3v) and SnO2 (C2v) show some preferable structures to enhance the MARX-Raman signal intensity through the structure factor which depends on the relative arrangement of the incident X-ray polarization and the surrounding local atomic geometry. The theoretical calculations help us to derive new information from the MARX-Raman. </p>

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