Barrier layer thickness dependence in GaInN/GaN superlattice characterized by<i> in situ</i> X-ray diffraction measurement
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- ohsumi junya
- Meijo Univ.
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- Ishihara Koji
- Meijo Univ.
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- Yamamoto Taiji
- Meijo Univ.
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- Iwaya Motoaki
- Meijo Univ.
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- Takeuchi Tetsuya
- Meijo Univ.
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- Kamiyama Satoshi
- Meijo Univ.
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- Akasaki Isamu
- Meijo Univ. Akasaki Research Center, Nagoya Univ.
Bibliographic Information
- Other Title
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- その場観察X回折法によるGaInN超格子の臨界膜厚のバリア層膜厚依存性評価
Journal
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- JSAP Annual Meetings Extended Abstracts
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JSAP Annual Meetings Extended Abstracts 2015.2 (0), 3112-3112, 2015-08-31
The Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1390295823372782848
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- ISSN
- 24367613
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- Text Lang
- ja
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- Data Source
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- JaLC