Estimation of Carrier Density of Widegap Semiconductor <i>β</i>-Ga<sub>2</sub>O<sub>3</sub> Single Crystals by THz Wave Reflection Measurement
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- Saito Shingo
- NICT
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- Onuma Takeyoshi
- NICT TNCT Kogakuin Univ.
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- Sasaki Kohei
- NICT Tamura Corp.
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- Kuramata Akito
- Tamura Corp.
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- Sekine Norihiko
- NICT
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- Kasamatsu Akifumi
- NICT
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- Higashiwaki Masataka
- NICT
Bibliographic Information
- Other Title
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- ワイドギャップ半導体β-Ga<sub>2</sub>O<sub>3</sub>単結晶のテラヘルツ波反射測定によるキャリア密度評価
Journal
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- JSAP Annual Meetings Extended Abstracts
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JSAP Annual Meetings Extended Abstracts 2015.1 (0), 3847-3847, 2015-02-26
The Japan Society of Applied Physics
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Keywords
Details 詳細情報について
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- CRID
- 1390296066525097728
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- ISSN
- 24367613
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- Text Lang
- ja
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- Data Source
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- JaLC