Improving the Precision of EDXRF using the Fundamental Parameter Method
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- YAMASAKI Keita
- Department of Materials Science and Engineering, Kyoto University
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- TANAKA Ryohei
- Department of Materials Science and Engineering, Kyoto University
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- KAWAI Jun
- Department of Materials Science and Engineering, Kyoto University
Bibliographic Information
- Other Title
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- FP法によるエネルギー分散蛍光X線の高精度化の基礎研究
Abstract
<p>We assess the quantitative accuracy of energy dispersive X-ray fluorescence (EDXRF) analysis by measuring spectra of stainless steel using an EDXRF spectrometer combined with a modified FP method whose integral variable is transformed from wavelength, λ, to energy, E. In the present paper, E2 term is included in the conventional FP method, which leads to the improvement of quantitative accuracy of EDXRF.</p>
Journal
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- Advances in X-Ray Chemical Analysis, Japan
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Advances in X-Ray Chemical Analysis, Japan 49 (0), 201-208, 2018-03-31
The Discussion Group of X-Ray Analysis, The Japan Society for Analytical Chemistry
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Details 詳細情報について
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- CRID
- 1390296918631767040
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- ISSN
- 27583651
- 09117806
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- Text Lang
- ja
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- Data Source
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- JaLC
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- Abstract License Flag
- Allowed