花粉の走査電子顕微鏡観察におけるナノスーツ法の応用

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  • “NanoSuit method” in scanning electron microscopy observation of pollen
  • カフン ノ ソウサ デンシ ケンビキョウ カンサツ ニ オケル ナノスーツホウ ノ オウヨウ

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Rice pollen was observed via field emission scanning electron microscopy (FE-SEM) under low-vacuum condition (LVC) and high-vacuum condition (HVC) using the following three methods: (1) “non-treatment method” without pretreatment, (2) “no-coating method” with pretreatment, but without metal coating, and (3) “NanoSuit method” with treatment using NanoSuit® solutions. The results were compared and discussed. We observed depressions on dry pollen in the non-treatment method and sculpture of spherical pollen surface in the no-coating method without charge-up under LVC. The NanoSuit® type I solution substantially shrunk the pollen, therefore, it was not suitable for SEM imaging under HVC. However, when treated with the type III solution, the spherical pollen could be observed without charge-up. The method utilizing NanoSuit® type III solution was simpler and more rapid than the conventional pretreatment, and these results prove that it is effective for SEM observation of pollen. Moreover, pollen sculpture can be observed in a near non-treated state under HVC. The problems of pollen-pollen adhesion and non-uniform film formation, which may be caused by residual solution, can be solved by examining the suspensions of solution and pollen and by altering the accelerating voltages during observation. Therefore, the NanoSuit method is expected to be used in future pollen research

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