書誌事項
- タイトル別名
-
- On the Validation of Partial Wetting Model at Si Microstructured Surface
抄録
<p>The partial wetting at nano/microstructured surfaces can be described using the intermediate wetting state between the Cassie-Baxter and Wenzel state. However, the limitation of partial wetting model is still unclear. In this study, surface free energy analysis at the microstructured Si-water interface was performed from both theoretical and experimental aspects to verify the partial wetting model. The effective wetting area was estimated by electrochemical impedance spectroscopy method for the further analysis of the surface free energy experimentally. The partial wetting model was verified at the fabricated microstructured surfaces with its geometrical parameters smaller than 400 μm.</p>
収録刊行物
-
- 熱工学コンファレンス講演論文集
-
熱工学コンファレンス講演論文集 2022 (0), 214-, 2022
一般社団法人 日本機械学会
- Tweet
キーワード
詳細情報 詳細情報について
-
- CRID
- 1390297902461414400
-
- ISSN
- 2424290X
-
- 本文言語コード
- ja
-
- データソース種別
-
- JaLC
- Crossref
-
- 抄録ライセンスフラグ
- 使用不可