Three-Dimensional Observation of Dislocation Structure by FIB-SEM

DOI

Bibliographic Information

Other Title
  • FIB-SEMによる転位組織の三次元観察

Description

<p>Three-dimensional visualization of dislocations by serial sectioning of SEM-ECCI images was performed on a creep-deformed nickel-based heat-resistant alloy. By performing serial tomograms of ECCI images, a volume of approximately 5 μm × 5 μm × 0.3 μm volume was successfully reconstructed. By incorporating the crystal orientation information obtained by the SEM-EBSD method, we confirmed that the three-dimensional arrangement of dislocations, such as slip planes and cross-slip, is accurately reflected in the three-dimensional volume. Thus, serial sectioning of ECCI images enables us to observe and analyze the bulk dislocation microstructure in three dimensions in the micrometer scale range.</p>

Journal

  • KENBIKYO

    KENBIKYO 58 (3), 90-94, 2023-12-30

    The Japanese Society of Microscopy

Keywords

Details 詳細情報について

  • CRID
    1390298753794987520
  • DOI
    10.11410/kenbikyo.58.3_90
  • ISSN
    24342386
    13490958
  • Text Lang
    ja
  • Data Source
    • JaLC
  • Abstract License Flag
    Disallowed

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