Real-time X-ray diffraction studies of surface structure during metalorganic chemical vapor deposition
-
- WATANABE Yoshio
- NTT Basic Research Laboratories
-
- KAWAMURA Tomoaki
- NTT Basic Research Laboratories
-
- BHUNIA Satyaban
- NTT Basic Research Laboratories
-
- FUJIKAWA Seiji
- Himeji Institute of Technology
Bibliographic Information
- Other Title
-
- 高輝度放射光を用いた気相成長表面の実時間X線回折
- 研究紹介 高輝度放射光を用いた気相成長表面の実時間X線回折
- ケンキュウ ショウカイ コウキド ホウシャコウ オ モチイタ キソウ セイチョウ ヒョウメン ノ ジツジカン Xセン カイセツ
Search this article
Abstract
<p>Reconstructed surface structure and real-time surface structure analyses were performed by using an in situ synchrotron radiation undulator X-ray diffractometer combining a goniometer and a MOCVD growth system. The P-rich InP (001) surface grown by MOCVD has a (2×1) super-structure, which consists of P-dimers. The real-time surface structure monitoring shows the relationship between the supply rate of gaseous sources and surface structures, and surface structure changing.</p>
Journal
-
- Oyo Buturi
-
Oyo Buturi 73 (5), 620-623, 2004-05-10
The Japan Society of Applied Physics
- Tweet
Keywords
Details 詳細情報について
-
- CRID
- 1390564227308900864
-
- NII Article ID
- 10012884330
-
- NII Book ID
- AN00026679
-
- ISSN
- 21882290
- 03698009
-
- NDL BIB ID
- 6945062
-
- Text Lang
- ja
-
- Data Source
-
- JaLC
- NDL
- CiNii Articles
-
- Abstract License Flag
- Disallowed